| |
Resonant x-ray scattering has been a powerful probe to characterize properties of new emergent materials. Sincemany of their interesting properties are originated from couplings between their charge, orbital and spin degrees offreedom, a diagnostic tool sensitive to all of them would be very desirable to understand the phenomena exhibitedin those materials. By exploiting energy- and polarization-dependence of resonant x-ray scattering intensities, thetechnique using hard x-rays from synchrotron has been very effective to investigate magnetic, orbital ordering ofrare-earth and 3d transition metal compounds since mid-1980's.1-4) However, experiments using hard x-rays havelimitations for measurements of ordering in 3d transition metal compounds since their energies do not match withthose of L-edges for 3d elements. Recent developments in soft x-ray scattering instrumentation allow us to investigateordering in 3d electrons by observing transition from 2p states directly. Soft x-rays have long wavelengths and shortpenetration lengths, which could be serious limitations for single crystal studies. But they match very well withdimensions of magnetic thin films and resonant soft x-ray scattering has been successfully utilized in analysis of thinfilms. In this lecture, principles and instrumentations of resonant x-ray scattering are introduced and results of typicalresonant x-ray scattering experiments are presented.
References
1. K. Namikawa,, M. Ando, T. Nakajima, and H. Kawata, J. Phys. Soc. Jpn., 54, 4099 (1985).
2. D. Gibbs, G. Grubel, D. R. Harshman, E. D. Isaacs, D. B. McWhan, D. Mills, and C. Vettier, Phys Rev. Lett.. 61,1241 (1988).
3. Y. Murakami, H. Kawada, H. Kawata, M. Tanaka, T. Arima, Y. Moritomo, and Y. Tokura, Phys. Rev. Lett., 80, 1932(1998).
4. S. Ji, C. Song, J. Koo, J. Park, Y. J. Park, K.-B. Lee, Seongsu Lee, J.-G. Park, J. Y. Kim, B. K. Cho, K.-P. Hong, C.-H.Lee, and F. Iga, Phys. Rev. Lett., 99, 076401 (2007).
|
