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X-ray diffraction technique for polycrystalline powdered samples is often used to study the phase purity, latticeparameter determination, crystal structure, texture and stress analysis, etc. This presentation, due to its short duration,will primarily deal with the data handling, and lattice parameter determination methods, using standard unit celldetermination method as well as the profile fitting analysis using Fullprof software. Some basics about the full Rietveldanalysis using the same Fullprof software will also be discussed.
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